Modeling electric field sensitive scanning probe measurements for a tip of arbitrary shape
arXiv:cond-mat/0309667
Abstract
We present a numerical method to model electric field sensitive scanning probe microscopy measurements which allows for a tip of arbtrary shape and invokes image charges to exactly account for a sample dielectric overlayer. The method is applied to calculate the spatial resolution of a subsurface charge accumulation imaging system, achieving reasonable agreement with experiment.
5 pages, 3 figures