69 citations · 146 across the 6 of their papers we have counts for
6 papers
Study of Surface Damage in Silicon by Irradiation with Focused Rubidium Ions
S. Xu, Y. Li, M. A. Verheijen +2
Cold atom ion sources have been developed and commercialized as alternative sources for focused ion beams (FIB). So far, applications and related research have not been widely repo…
Dual mode microwave deflection cavities for ultrafast electron microscopy
J. F. M. van Rens, W. Verhoeven, E. R. Kieft +2
This paper presents the experimental realization of an ultrafast electron microscope operating at a repetition rate of 75 MHz based on a single compact resonant microwave cavity op…
Design and characterization of dielectric filled TM microwave cavities for ultrafast electron microscopy
W. Verhoeven, J. F. M. van Rens, A. H. Kemper +6
Microwave cavities oscillating in the TM mode can be used as dynamic electron-optical elements inside an electron microscope. By filling the cavity with a dielectric materi…
Time-of-Flight Electron Energy Loss Spectroscopy by Longitudinal Phase Space Manipulation with Microwave Cavities
W. Verhoeven, J. F. M. van Rens, W. F. Toonen +3
The possibility to perform high-resolution time-resolved electron energy loss spectroscopy has the potential to impact a broad range of research fields. Resolving small energy loss…
High quality ultrafast transmission electron microscopy using resonant microwave cavities
W. Verhoeven, J. F. M. van Rens, E. R. Kieft +2
Ultrashort, low-emittance electron pulses can be created at a high repetition rate by using a TM deflection cavity to sweep a continuous beam across an aperture. These puls…
Theory and particle tracking simulations of a resonant radiofrequency deflection cavity in TM mode for ultrafast electron microscopy
J. F. M. van Rens, W. Verhoeven, J. G. H. Franssen +5
We present a theoretical description of resonant radiofrequency (RF) deflecting cavities in TM mode as dynamic optical elements for ultrafast electron microscopy. We first…