High quality ultrafast transmission electron microscopy using resonant microwave cavities

W. Verhoeven; J. F. M. van Rens; E. R. Kieft; P. H. A. Mutsaers; O. J. Luiten

doi:10.1016/j.ultramic.2018.03.012

paper

High quality ultrafast transmission electron microscopy using resonant microwave cavities

arXiv:1709.02205 · doi:10.1016/j.ultramic.2018.03.012

Abstract

Ultrashort, low-emittance electron pulses can be created at a high repetition rate by using a TM $_{110}$ deflection cavity to sweep a continuous beam across an aperture. These pulses can be used for time-resolved electron microscopy with atomic spatial and temporal resolution at relatively large average currents. In order to demonstrate this, a cavity has been inserted in a transmission electron microscope, and picosecond pulses have been created. No significant increase of either emittance or energy spread has been measured for these pulses. At a peak current of $814 \pm 2$ pA, the root-mean-square transverse normalized emittance of the electron pulses is $ε_{n, x} = (2.7 \pm 0.1) \cdot 1 0^{- 12}$ m rad in the direction parallel to the streak of the cavity, and $ε_{n, y} = (2.5 \pm 0.1) \cdot 1 0^{- 12}$ m rad in the perpendicular direction for pulses with a pulse length of 1.1-1.3 ps. Under the same conditions, the emittance of the continuous beam is $ε_{n, x} = ε_{n, y} = (2.5 \pm 0.1) \cdot 1 0^{- 12}$ m rad. Furthermore, for both the pulsed and the continuous beam a full width at half maximum energy spread of $0.95 \pm 0.05$ eV has been measured.

High quality ultrafast transmission electron microscopy using resonant microwave cavities

Abstract

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