Design and characterization of dielectric filled TM${}_{110}$ microwave cavities for ultrafast electron microscopy

Abstract

Microwave cavities oscillating in the TM${}_{110}$ mode can be used as dynamic electron-optical elements inside an electron microscope. By filling the cavity with a dielectric material it becomes more compact and power efficient, facilitating the implementation in an electron microscope. However, the incorporation of the dielectric material makes the manufacturing process more difficult. Presented here are the steps taken to characterize the dielectric material, and to reproducibly fabricate dielectric filled cavities. Also presented are two versions with improved capabilities. The first, called a dual-mode cavity, is designed to support two modes simultaneously. The second has been optimized for low power consumption. With this optimized cavity a magnetic field strength of 2.84 $\pm$ 0.07 mT was generated at an input power of 14.2 $\pm$ 0.2 W. Due to the low input powers and small dimensions, these dielectric cavities are ideal as electron-optical elements for electron microscopy setups.

References in corpus (8)

• Ultrafast transmission electron microscopy using a laser-driven field emitter: femtosecond resolution with a high coherence electron beam
• Compression of sub-relativistic space-charge-dominated electron bunches for single-shot femtosecond electron diffraction
• Direct measurement of sub-10 fs relativistic electron beams with ultralow emittance
• Laser-Induced Skyrmion Writing and Erasing in an Ultrafast Cryo-Lorentz Transmission Electron Microscopy
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• Solving the Jitter Problem in Microwave Compressed Ultrafast Electron Diffraction Instruments: Robust Sub-50 fs Cavity-Laser Phase Stabilization
• Dual mode microwave deflection cavities for ultrafast electron microscopy
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