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physics.space-ph2019
Enhanced low-flux sensitivity (ELFS) effect of neutron-induced displacement damage in bipolar devices: physical mechanism and parametric model
Yang Liu, Ying Zhang, Mu Lan +2
Similar to the enhanced low-dose-rate sensitivity (ELDRS) effect of ionization damage, an enhanced low-flux senstivity (ELFS) effect has been reported in ions/neutron irradiation o…
cond-mat.mtrl-sci2019★ 6 cited
Ultra-Slow Dynamic Annealing of Neutron-induced Defects in n-type Silicon: Role of Charge Carriers
Ying Zhang, Yang Liu, Hang Zhou +3
Neutron bombardments with equivalent fluence (110 cm) and different fluxes (10 cms to 10 cms) have bee…