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physics.space-ph2019
Enhanced low-flux sensitivity (ELFS) effect of neutron-induced displacement damage in bipolar devices: physical mechanism and parametric model
Yang Liu, Ying Zhang, Mu Lan +2
Similar to the enhanced low-dose-rate sensitivity (ELDRS) effect of ionization damage, an enhanced low-flux senstivity (ELFS) effect has been reported in ions/neutron irradiation o…
physics.space-ph2018
Strong Proton-Defect Interaction in Synergistic Irradiation Damage System
Ying Zhang, Yang Liu, Jie Zhao +3
We experimentally investigated total ionizing dose (TID) response of the input-stage PNP transitor in an operational amplifier LM324N with various initial displacement damage (IDD)…
physics.space-ph2017
Reduced Low Dose Rate Sensitivity and its Mechanism in Bipolar Junction Transistors
Xiao-Long Feng, Zi-Bo Wang, Yang Liu +1
It is surprising that only an enhanced low-dose-rate sensitivity (ELDRS), but not its contrariety, a reduced low-dose-rate sensitivity (RLDRS), is experimentally observed in bipola…