Entangled-photon ellipsometry
arXiv:quant-ph/0202088 · doi:10.1364/JOSAB.19.001174
Abstract
Performing reliable measurements in optical metrology, such as those needed in ellipsometry, requires a calibrated source and detector, or a well-characterized reference sample. We present a novel interferometric technique to perform reliable ellipsometric measurements. This technique relies on the use of a non-classical optical source, namely polarization-entangled twin photons generated by spontaneous parametric downconversion from a nonlinear crystal, in conjunction with a coincidence-detection scheme. Ellipsometric measurements acquired with this scheme are absolute, i.e., they require neither source nor detector calibration, nor do they require a reference.
23 pages, 4 figures. Accepted for publication in J. Opt. Soc. Am. B
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