An optical fiber-taper probe for wafer-scale microphotonic device characterization

Abstract

A small depression is created in a straight optical fiber taper to form a local probe suitable for studying closely spaced, planar microphotonic devices. The tension of the "dimpled" taper controls the probe-sample interaction length and the level of noise present during coupling measurements. Practical demonstrations with high-Q silicon microcavities include testing a dense array of undercut microdisks (maximum Q = 3.3x10^6) and a planar microring (Q = 4.8x10^6).

8 pages, 5 figures, for high-res version see http://copilot.caltech.edu/publications/index.htm

References in corpus (3)

• Measuring the role of surface chemistry in silicon microphotonics
• Efficient input and output fiber coupling to a photonic crystal waveguide
• Photoluminescence measurements of quantum-dot-containing semiconductor microdisk resonators using optical fiber taper waveguides

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• Photon-level tuning of photonic nanocavities
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• GHz optomechanical resonators with high mechanical Q factor in air
• Magnetic Actuation and Feedback Cooling of a Cavity Optomechanical Torque Sensor
• Two-Level System Damping in a Quasi-One-Dimensional Optomechanical Resonator
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• Surface Encapsulation for Low-Loss Silicon Photonics
• Refractometric sensing of Li salt with visible-light Si3N4 microdisk resonators
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