189 citations · 1k across the 11 of their papers we have counts for
11 papers
Accurate measurement of scattering and absorption loss in microphotonic devices
Matthew Borselli, Thomas J. Johnson, Oskar Painter
We present a simple measurement and analysis technique to determine the fraction of optical loss due to both radiation (scattering) and linear absorption in microphotonic component…
Surface Encapsulation for Low-Loss Silicon Photonics
M. Borselli, T. J. Johnson, C. P. Michael +2
Encapsulation layers are explored for passivating the surfaces of silicon to reduce optical absorption in the 1500-nm wavelength band. Surface-sensitive test structures consisting…
An optical fiber-taper probe for wafer-scale microphotonic device characterization
C. P. Michael, M. Borselli, T. J. Johnson +2
A small depression is created in a straight optical fiber taper to form a local probe suitable for studying closely spaced, planar microphotonic devices. The tension of the "dimple…
Measuring the role of surface chemistry in silicon microphotonics
Matthew Borselli, Thomas J. Johnson, Oskar Painter
The silicon/silicon dioxide (Si/SiO2) interface plays a crucial role in the performance, cost, and reliability of most modern microelectronic devices, from the basic transistor to…
Cavity Q, mode volume, and lasing threshold in small diameter AlGaAs microdisks with embedded quantum dots
Kartik Srinivasan, Matthew Borselli, Andreas Stintz +2
The quality factor (Q), mode volume (Veff), and room-temperature lasing threshold of microdisk cavities with embedded quantum dots (QDs) are investigated. Finite element method sim…
Optical loss and lasing characteristics of high-quality-factor AlGaAs microdisk resonators with embedded quantum dots
Kartik Srinivasan, Matthew Borselli, Thomas J. Johnson +4
Optical characterization of AlGaAs microdisk resonant cavities with a quantum dot active region is presented. Direct passive measurement of the optical loss within AlGaAs microdisk…