113 citations · 522 across the 7 of their papers we have counts for
7 papers
Accurate measurement of scattering and absorption loss in microphotonic devices
Matthew Borselli, Thomas J. Johnson, Oskar Painter
We present a simple measurement and analysis technique to determine the fraction of optical loss due to both radiation (scattering) and linear absorption in microphotonic component…
Surface Encapsulation for Low-Loss Silicon Photonics
M. Borselli, T. J. Johnson, C. P. Michael +2
Encapsulation layers are explored for passivating the surfaces of silicon to reduce optical absorption in the 1500-nm wavelength band. Surface-sensitive test structures consisting…
An optical fiber-taper probe for wafer-scale microphotonic device characterization
C. P. Michael, M. Borselli, T. J. Johnson +2
A small depression is created in a straight optical fiber taper to form a local probe suitable for studying closely spaced, planar microphotonic devices. The tension of the "dimple…
Wavelength- and material-dependent absorption in GaAs and AlGaAs microcavities
C. P. Michael, K. Srinivasan, T. J. Johnson +5
The quality factors of modes in nearly identical GaAs and Al_{0.18}Ga_{0.82}As microdisks are tracked over three wavelength ranges centered at 980 nm, 1460 nm, and 1600 nm, with qu…
Measuring the role of surface chemistry in silicon microphotonics
Matthew Borselli, Thomas J. Johnson, Oskar Painter
The silicon/silicon dioxide (Si/SiO2) interface plays a crucial role in the performance, cost, and reliability of most modern microelectronic devices, from the basic transistor to…
Optical loss and lasing characteristics of high-quality-factor AlGaAs microdisk resonators with embedded quantum dots
Kartik Srinivasan, Matthew Borselli, Thomas J. Johnson +4
Optical characterization of AlGaAs microdisk resonant cavities with a quantum dot active region is presented. Direct passive measurement of the optical loss within AlGaAs microdisk…