On the role of step-flow advection during electromigration-induced step bunching

Abstract

We propose a one-dimensional model based on the Burton-Cabrera-Frank equations to describe the electromigration-induced step bunching instability on vicinal surfaces. The step drift resulting from atomic evaporation and/or deposition is explicitly included in our model. A linear stability analysis reveals several stability inversions as the evaporation rate varies, while a deposition flux is shown to have a stabilizing effect.

4 pages

References in corpus (1)

• Dynamic phase transitions in electromigration-induced step bunching

Cited by in corpus (3)

• Coexistence of bunching and meandering instability in simulated growth of 4H-SiC(0001) surface
• Instabilities at vicinal crystal surfaces - competition between the electromigration of the adatoms and the kinetic memory effect
• Emergence of local geometric laws of step flow in homoepitaxial growth