Local electromigration model for crystal surfaces

Abstract

We analyze the dynamics of crystal surfaces in the presence of electromigration. From a phase field model with a migration force which depends on the local geometry, we derive a step model with additional contributions in the kinetic boundary conditions. These contributions trigger various surface instabilities, such as step meandering, bunching and pairing on vicinal surfaces. Experiments are discussed.

References in corpus (2)

• A unified treatment of current-induced instabilities on Si surfaces
• From Discrete Hopping to Continuum Modeling on Vicinal Surfaces with Applications to Si(001) Electromigration

Cited by in corpus (8)

• Vicinal silicon surfaces: from step density wave to faceting
• On the role of step-flow advection during electromigration-induced step bunching
• Electromigration-Induced Step Meandering on Vicinal Surfaces: Nonlinear Evolution Equation
• Morphological stability of electromigration-driven vacancy islands
• Nonlinear wavelength selection in surface faceting under electromigration
• Analysis of a combined influence of substrate wetting and surface electromigration on a thin film stability and dynamical morphologies
• Electromigration-guided composition patterns in thin alloy films: a computational study
• Electromigration-driven Evolution of the Surface Morphology and Composition for a Bi-Component Solid Film