Microscopic Model of Critical Current Noise in Josephson Junctions
arXiv:cond-mat/0612410 · doi:10.1103/PhysRevLett.99.207001
Abstract
We present a simple microscopic model to show how fluctuating two--level systems in the Josephson junction tunnel barrier of thickness can modify the potential energy of the barrier and produce critical current noise spectra. We find low frequency noise that goes as . Our values are in good agreement with recent experimental measurements of critical current noise in Al/AlO/Al Josephson junctions. We also investigate the sensitivity of the noise on the nonuniformity of the tunnel barrier.
4 pages, 3 figures
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