Effect of strong localization of doped holes in angle-resolved photoemission spectra of La${}_{1-x}$Sr${}_x$FeO${}_3$

Abstract

We have performed an angle-resolved photoemission spectroscopy study of La${}_{0.6}$Sr${}_{0.4}$FeO${}_3$ using {\it in situ} prepared thin films and determined its band structure. The experimental band dispersions could be well explained by an empirical band structure assuming the G-type antiferromagnetic state. However, the Fe 3d bands were found to be shifted downward relative to the Fermi level ($E_F$) by $\sim 1$ eV compared with the calculation and to form a (pseudo)gap of $\sim 1$ eV at $E_F$. We attribute this observation to a strong localization effect of doped holes due to polaron formation.

5 pages, 5 figures

References in corpus (5)

• Hole-doping-induced changes in the electronic structure of La${}_{1-x}$Sr${}_x$FeO${}_3$ : soft x-ray photoemission and absorption study of epitaxial thin films
• Polaronic behavior of undoped high-Tc cuprates
• High-energy photoemission on Fe3O4: Small polaron physics and the Verwey transition
• The band structure and Fermi surface of La${}_{0.6}$Sr${}_{0.4}$MnO${}_3$ thin films studied by in-situ angle-resolved photoemission spectroscopy
• Temperature-dependent soft x-ray photoemission and absorption studies of charge disproportionation in La${}_{1-x}$Sr${}_x$FeO${}_3$

Cited by in corpus (4)

• Electronic structure of pristine and Ni-substituted LaFeO${}_3$ from near edge x-ray absorption fine structure experiments and first-principles simulations
• Pushing the Study of Point Defects in Thin Film Ferrites to Low Temperatures Using In Situ Ellipsometry
• Systematic tight-binding analysis of ARPES spectra of transition-metal oxides
• Correlation of high temperature X-ray photoemission spectral features and conductivity of epitaxially strained (La0.8Sr0.2)0.95Ni0.2Fe0.8O3/SrTiO3(110)