Correlation of high temperature X-ray photoemission spectral features and conductivity of epitaxially strained (La0.8Sr0.2)0.95Ni0.2Fe0.8O3/SrTiO3(110)

Abstract

Reversible and irreversible discontinuities at around 573 K and 823 K in the electric conductivity of a strained 175 nm thin film of (La0.8Sr0.2)0.95Ni0.2Fe0.8O3-δ grown by pulsed laser deposition on SrTiO3 (110) are reflected by valence band changes as monitored in photoemission and oxygen K-edge x-ray absorption spectra. The irreversible jump at 823 K is attributed to depletion of doped electron holes and reduction of Fe4+ to Fe3+, as evidenced by oxygen and iron core level soft x-ray spectroscopy, and possibly of a chemical origin, whereas the reversible jump at 573 K possibly originates from structural changes.

References in corpus (2)

• Effect of strong localization of doped holes in angle-resolved photoemission spectra of La${}_{1-x}$Sr${}_x$FeO${}_3$
• Electron hole - phonon interaction and structural changes in La0.9Sr0.1FeO3 by temperature dependent conductivity and valence band photoemission spectros-copy

Cited by in corpus (2)

• Correlation of conductivity and angle integrated valence band photoemission characteristics in single crystal iron perovskites for 300 K < T < 800 K: Comparison of surface and bulk sensitive methods
• High temperature oxygen NEXAFS valence band spectra and conductivity of LaFe3/4Ni1/4O3 from 300 K to 773 K