Critical temperature of superconducting bilayers: theory and experiment
arXiv:cond-mat/0407320 · doi:10.1063/1.1470712
Abstract
A generalized model for the critical temperature Tc of superconducting bilayers is presented, which is valid with no restrictions to film thicknesses, Tc of the layers and interface resistivity. The model is verified experimentally on a series of Nb-Al and Ta-Al bilayers with Nb, Ta layer thicknesses of 100 nm and Al layer thicknesses ranging from 5 nm to 200 nm. Excellent agreement between theory and experiment was found for the energy gap and the Tc of bilayers. The results are important for designing practical superconducting devices.
3 pages, 2 figures
References in corpus (3)
Cited by in corpus (10)
- Negative differential thermal conductance and heat amplification in superconducting hybrid devices
- Transition Edge Sensors: Physics and Applications
- Phase-control of bipolar thermoelectricity in Josephson tunnel junctions
- Calculation and measurement of critical temperature in thin superconducting multilayers
- Nonlinear Properties of Supercurrent-Carrying Single and Multi-Layer Thin-Film Superconductors
- Tuning vortex fluctuations and the resistive transition in superconducting films with a thin overlayer
- Controlling of Iridium Films Using the Proximity Effect
- Energy-dependent kinetic model of photon absorption by superconducting tunnel junctions
- Engineering Nonlinear Response of Superconducting Niobium Microstrip Resonators via Aluminum Cladding
- Proximity effect in Nb-Mo layered films: Transition temperature and critical current dependence on period