Observation of non-gaussian conductance fluctuations at low temperatures in Si:P(B) at the metal-insulator transition
arXiv:cond-mat/0212165 · doi:10.1103/PhysRevLett.91.216603
Abstract
We report investigations of conductance fluctuations (noise) in doped silicon at low temperatures (TK) as it is tuned through the metal-insulator transition (MIT). The scaled magnitude of noise, , increases with decrease in T following an approximate power law . At low T, diverges as crosses 1 from the metallic side. We find that the distribution function and second spectrum of the fluctuations show strong non-gaussian behavior below 20K as decreases through 1. In particular, the observed distribution function which is gaussian for , develops a log-normal tail as the transition is approached from the metallic side and eventually it dominates in the critical region.
arXiv comment9 pages, 5 figures
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