Signature of Martensite transformation on conductivity noise in thin films of NiTi shape memory alloys

Abstract

Slow time-dependent fluctuations, or noise, in the electrical resistance of dc magnetron sputtered thin films of Nickel Titanium shape memory alloys have been measured. Even in equilibrium, the noise was several orders of magnitude larger than that of simple diffusive metallic films, and was found to be non-monotonic around the martensitic transformation regime. The results are discussed in terms of dynamics of structural defects, which also lay foundation to a new noise-based characterization scheme of martensite transformation.

arXiv comment4 pages, 3 figures

References in corpus (3)

• On the athermal character of structural phase transitions
• Observation of non-gaussian conductance fluctuations at low temperatures in Si:P(B) at the metal-insulator transition
• Universal conductance fluctuations in three dimensional metallic single crystals of Si

Cited by in corpus (4)

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