Copper-impurity-free photonic integrated circuits enable deterministic soliton microcombs

Abstract

Chip-scale optical frequency combs based on microresonators (microcombs) enable GHz-THz repetition rates, broad bandwidth, compactness, and compatibility with wafer-scale manufacturing. Silicon nitride photonic integrated circuits have become a leading platform due to their low loss, broad transparency, lithographic dispersion control, and commercial 200-mm-wafer foundry access. They have enabled system-level applications in optical communications, LiDAR, frequency synthesis, low-noise microwave generation, and convolutional processing. However, real-world deployment is hindered by the challenge of deterministic soliton microcomb generation, primarily due to thermal instabilities. Although techniques like pulsed pumping, fast scanning, and auxiliary lasers help mitigate these effects, they often add complexity or reduce soliton stability. In this work, we overcome thermal limitations and demonstrate deterministic soliton generation in silicon nitride photonic circuits. We trace the thermal effects to copper impurities within waveguides, originating from residual contaminants in CMOS-grade silicon wafers that are gettered into silicon nitride during fabrication. By developing effective copper removal techniques, we significantly reduce thermal instabilities. This enables soliton generation with arbitrary or slow laser scanning, removing a key barrier to microcomb deployment. Our approach is compatible with front-end-of-line foundry processing, paving the way for broader adoption of soliton microcomb technologies.

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Cited by in corpus (1)

• Sputtered AlN buffer layer for low-loss crystalline AlN-on-sapphire integrated photonics