Andreev Reflection in the Quantum Hall Regime at an Al/InAs Junction on a Cleaved Edge
arXiv:2407.21557 · doi:10.1021/acs.nanolett.4c04223
Abstract
We have fabricated a superconductor/semiconductor (S/Sm) junction composed of Al and InAs using cleaved edge overgrowth. By exploiting the unique geometry with a thin Al/Pt/Al trilayer formed on the side surface of an in-situ cleaved heterostructure wafer containing an InAs quantum well, we achieve a superconducting critical field of 5 T, allowing superconductivity and quantum Hall (QH) effects to coexist down to Landau-level filling factor nu = 3. Andreev reflection at zero magnetic field shows a conductance enhancement that is limited solely by the Fermi velocity mismatch, demonstrating a virtually barrier-free, high-quality S/Sm junction. Bias spectroscopy in the QH regime reveals the opening of a superconducting gap, with the reduced downstream resistance demonstrating that the electron-hole Andreev conversion probability consistently exceeds 50%. Our results, obtained in a new experimental regime characterized by a clean edge-contacted junction with a superconducting electrode narrower than the coherence length, open new avenues for both theoretical and experimental studies of the interplay between superconductivity and QH effects and the engineering of exotic quasiparticles.
arXiv comment7 pages, 4 figures
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