Uncovering the Three-Dimensional Structure of Upconverting Core-Shell Nanoparticles with Multislice Electron Ptychography
arXiv:2402.10084 · doi:10.1063/5.0206814
Abstract
In photon upconverting core-shell nanoparticles, structure strongly dictates performance. Conventional imaging in scanning transmission electron microscopy has sufficient resolution to probe the atomic structure of these nanoparticles, but contrast, dose, and projection limitations make conventional imaging modes insufficient for fully characterizing these structures. Phase retrieval methods provide a promising alternative imaging mode, and in particular, multislice electron ptychography can recover depth-dependent information. Here, we study beam-sensitive photon upconverting core-shell nanoparticles with a multislice ptychography approach using a low electron dose to avoid damage. Large strain fields arise in these heterostructures due to the mismatch in lattice parameter between the core and the shell. We reconstruct both a nanoparticle that appears defect-free and one that has a large break in the side and map the distribution of strain in 3D by computing distortion fields from high-resolution potential images of each slice. In the defect-free nanoparticle, we observe twisting of the shell, while in the broken nanoparticle we measure the 3D position of the crack, the core, and dislocations. These results highlight the advantage of multislice electron ptychography to recover 3D information from a single scan, even under strict electron dose requirements from beam-sensitive samples.
arXiv comment6 pages, 4 figures
References in corpus (9)
- Electron ptychography achieves atomic-resolution limits set by lattice vibrations
- py4DSTEM: a software package for multimodal analysis of four-dimensional scanning transmission electron microscopy datasets
- Visualization of Oxygen Vacancies and Self-doped Ligand Holes in La3Ni2O7-δ
- Indefinite and Bidirectional Near Infrared Nanocrystal Photoswitching
- Solving Complex Nanostructures With Ptychographic Atomic Electron Tomography
- Iterative Phase Retrieval Algorithms for Scanning Transmission Electron Microscopy
- Multislice Electron Tomography using 4D-STEM
- Uncovering the Three-Dimensional Structure of Upconverting Core-Shell Nanoparticles with Multislice Electron Ptychography
- Advanced Techniques in Automated High Resolution Scanning Transmission Electron Microscopy
Cited by in corpus (5)
- Infrared nanosensors of pico- to micro-newton forces
- Uncovering the Three-Dimensional Structure of Upconverting Core-Shell Nanoparticles with Multislice Electron Ptychography
- 3D Atomic-Scale Metrology of Strain Relaxation and Roughness in Gate-All-Around (GAA) Transistors via Electron Ptychography
- Ultra-fast Digital DPC Yielding High Spatio-Temporal Resolution for Low-Dose Phase Characterisation
- Advancing atomic electron tomography with neural networks