2 papers
physics.ins-det2025
Robust electron counting for direct electron detectors with the Back-Propagation Counting method
Joshua Renner, Matthew A. Wright, Kristofer Bouchard +6
Electron microscopy (EM) is a foundational tool for directly assessing the structure of materials. Recent advances in direct electron detectors have improved signal-to noise ratios…
cond-mat.mtrl-sci2024
Uncovering the Three-Dimensional Structure of Upconverting Core-Shell Nanoparticles with Multislice Electron Ptychography
Stephanie M. Ribet, Georgios Varnavides, Cassio C. S. Pedroso +4
In photon upconverting core-shell nanoparticles, structure strongly dictates performance. Conventional imaging in scanning transmission electron microscopy has sufficient resolutio…