Measurement-Based Entanglement of Semiconductor Spin Qubits

Abstract

Measurement-based entanglement is a method for entangling quantum systems through the state projection that accompanies a parity measurement. We derive a stochastic master equation describing measurement-based entanglement of a pair of silicon double-dot flopping-mode spin qubits, develop numerical simulations to model this process, and explore what modifications could enable an experimental implementation of such a protocol. With device parameters corresponding to current qubit and cavity designs, we predict an entanglement fidelity $F_e\approx$ 61%. By increasing the cavity outcoupling rate by a factor of ten, we are able to obtain a simulated $F_e\approx$ 81% while maintaining a yield of 33%.

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