Cryogenic spin Peltier effect detected by a RuO$_2$-AlO$_x$ on-chip microthermometer

Takashi Kikkawa; Haruka Kiguchi; Alexey A. Kaverzin; Ryo Takahashi; Eiji Saitoh

doi:10.1103/PhysRevApplied.20.054006

paper

Cryogenic spin Peltier effect detected by a RuO $_{2}$ -AlO $_{x}$ on-chip microthermometer

arXiv:2311.01711 · doi:10.1103/PhysRevApplied.20.054006

Abstract

We report electric detection of the spin Peltier effect (SPE) in a bilayer consisting of a Pt film and a Y $_{3}$ Fe $_{5}$ O $_{12}$ (YIG) single crystal at the cryogenic temperature $T$ as low as 2 K based on a RuO $_{2}$ $-$ AlO $_{x}$ on-chip thermometer film. By means of a reactive co-sputtering technique, we successfully fabricated RuO $_{2}$ $-$ AlO $_{x}$ films having a large temperature coefficient of resistance (TCR) of $\sim 100% K^{- 1}$ at around $2 K$ . By using the RuO $_{2}$ $-$ AlO $_{x}$ film as an on-chip temperature sensor for a Pt/YIG device, we observe a SPE-induced temperature change on the order of sub- $μ K$ , the sign of which is reversed with respect to the external magnetic field $B$ direction. We found that the SPE signal gradually decreases and converges to zero by increasing $B$ up to $10 T$ . The result is attributed to the suppression of magnon excitations due to the Zeeman-gap opening in the magnon dispersion of YIG, whose energy much exceeds the thermal energy at 2 K.

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Cryogenic spin Peltier effect detected by a RuO2​-AlOx​ on-chip microthermometer

Abstract

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Cryogenic spin Peltier effect detected by a RuO $_{2}$ -AlO $_{x}$ on-chip microthermometer