Adhesion of 2D MoS to Graphite and Metal Substrates Measured by a Blister Test
arXiv:2304.09263 · doi:10.1021/acs.nanolett.2c04886
Abstract
Using a blister test, we measured the work of separation between MoS membranes from metal, semiconductor, and graphite substrates. We found a work of separation ranging from 0.11 +- 0.05 J/m^2 for chromium to 0.39 +- 0.1 J/m^2 for graphite substrates. In addition, we measured the work of adhesion of MoS membranes over these substrates and observed a dramatic difference between the work of separation and adhesion which we attribute to adhesion hysteresis. Due to the prominent role that adhesive forces play in the fabrication and functionality of devices made from 2D materials, an experimental determination of the work of separation and adhesion as provided here will help guide their development.
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