The Synthescope: A Vision for Combining Synthesis with Atomic Fabrication
arXiv:2302.08539 · doi:10.1002/adma.202301560
Abstract
The scanning transmission electron microscope, a workhorse instrument in materials characterization, is being transformed into an atomic-scale material manipulation platform. With an eye on the trajectory of recent developments and the obstacles toward progress in this field, we provide a vision for a path toward an expanded set of capabilities and applications. We reconceptualize the microscope as an instrument for fabrication and synthesis with the capability to image and characterize atomic-scale structural formation as it occurs. Further development and refinement of this approach may have substantial impact on research in microelectronics, quantum information science, and catalysis where precise control over atomic scale structure and chemistry of a few "active sites" can have a dramatic impact on larger scale functionality and where developing a better understanding of atomic scale processes can help point the way to larger scale synthesis approaches.
References in corpus (19)
- Electron beam nanosculpting of suspended graphene sheets
- From Graphene constrictions to single carbon chains
- Atomic-scale electron-beam sculpting of defect-free graphene nanostructures
- Manipulating low-dimensional materials down to the level of single atoms with electron irradiation
- A kilobyte rewritable atomic memory
- Silicon-carbon bond inversions driven by 60 keV electrons in graphene
- Single atom manipulation and control in a scanning transmission electron microscope
- Assembling Di- and Multiatomic Si Clusters in Graphene via Electron Beam Manipulation
- Towards atomically precise manipulation of 2D nanostructures in the electron microscope
- Doping transition-metal atoms in graphene for atomic-scale tailoring of electronic, magnetic, and quantum topological properties
- Direct atomic fabrication and dopant positioning in Si using electron beams with active real time image-based feedback
- In-situ electronic characterization of graphene nanoconstrictions fabricated in a transmission electron microscope
- Single-electron spin resonance in a nanoelectronic device using a global field
- Electron-beam Introduction of Heteroatomic Pt-Si Structures in Graphene
- Doping of Cr in Graphene Using Electron Beam Manipulation for Functional Defect Engineering
- The role of temperature on defect diffusion and nanoscale patterning in graphene
- Direct-Writing Atom-by-Atom
- Top-down fabrication of atomic patterns in twisted bilayer graphene
- Mapping Conductance and Switching Behavior of Graphene Devices In Situ