Kinetic Inductive Electromechanical Transduction for Nanoscale Force Sensing

Abstract

We use the principles of cavity optomechanics to design a resonant mechanical force sensor for atomic force microscopy. The sensor is based on a type of electromechanical coupling, dual to traditional capacitive coupling, whereby the motion of a cantilever induces surface strain that causes a change in the kinetic inductance of a superconducting nanowire. The cavity is realized by a compact microwave-plasma mode with an equivalent $LC$ circuit involving the kinetic inductance of the nanowire. The device is fully coplanar and we show how to transform the cavity impedance for optimal coupling to the transmission line and the following amplifier. For the device presented here, we estimate the bare kinetic inductive mechano-electric coupling (KIMEC) rate $g_0/2\pi$ in the range 3-10 Hz. We demonstrate phase-sensitive detection of cantilever motion using a multifrequency pumping and measurement scheme.

10 pages, 4 figures

References in corpus (5)

• Sideband Cooling Micromechanical Motion to the Quantum Ground State
• Nanomechanical motion measured with precision beyond the standard quantum limit
• Optomechanical transduction of an integrated silicon cantilever probe using a microdisk resonator
• Nonlinearities and Parametric Amplification in Superconducting Coplanar Waveguide Resonators
• A near-ideal degenerate parametric amplifier

Cited by in corpus (4)

• Temperature dependence of microwave losses in lumped-element resonators made from superconducting nanowires with high kinetic inductance
• Sensing force gradients with cavity optomechanics while evading backaction
• Intrinsic Kerr amplification for microwave electromechanics
• Design, fabrication and characterization of kinetic-inductive force sensors for scanning probe applications