Ultra-Low-Loss Silicon Nitride Photonics Based on Deposited Films Compatible with Foundries

Abstract

The fabrication processes of silicon nitride photonic devices used in foundries require low temperature deposition, which typically leads to high propagation losses. Here, we show that propagation loss as low as 0.42 dB/cm can be achieved using foundry compatible processes by solely reducing waveguide surface roughness. By post-processing the fabricated devices using rapid thermal anneal (RTA) and furnace anneal, we achieve propagation losses down to 0.28 dB/cm and 0.06 dB/cm, respectively. These low losses are comparable to the conventional devices using high temperature, high-stress low-pressure chemical vapor deposition (LPCVD) films. We also tune the dispersion of the devices, and proved that these devices can be used for linear and nonlinear applications. Low threshold parametric oscillation, broadband frequency combs and narrow-linewidth laser are demonstrated. Our work demonstrates the feasibility of scalable photonic systems based on foundries.

References in corpus (2)

• Chip-based frequency combs sources for optical coherence tomography
• Molecular-absorption-induced thermal bistablity in PECVD silicon nitride microring resonators

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• Million-Q Dual-Polarization Micro-Fabry-Perot Resonators in Silicon Nitride Photonic Integrated Circuits
• Octave Spanning Visible to SWIR Integrated Coil-Stabilized Brillouin Lasers