Tunable biaxial strain device for low dimensional materials

Abstract

Strain is attracting much interest as a mean to tune the properties of thin exfoliated two-dimensional materials and their heterostructures. Numerous devices to apply tunable uniaxial strain are proposed in the literature, but only few for biaxial strain where there is often a trade-off between maximum strain and uniformity, reversibility and device size. We present a compact device that allows the controlled application of uniform in-plane biaxial strain, with maximum deformation and uniformity comparable to those found in much larger devices. Its performance and strain uniformity over the sample area are modeled using finite element analysis and demonstrated by measuring the response of exfoliated 2H-MoS${}_2$ to strain by Raman spectroscopy.

arXiv comment10 pages, 4 figures

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Cited by in corpus (3)

• Giant atomic swirl in graphene bilayers with biaxial heterostrain
• Measurements of absolute bandgap deformation-potentials of optically-bright bilayer WSe${}_2$
• Compact computer controlled biaxial tensile device for low-temperature transport measurements of layered materials