Transmission Electron Microscopy at the Quantum Limit

Abstract

A number of visions for a new generation of dose-efficient electron microscopes have been advanced. These proposals, while inspired by quantum principles, make little contact with the broader field of quantum metrology. We discuss a framework calculating the amount of information carried by each electron. This makes it possible to evaluate the potential effectiveness of any particular microscope architecture relative to the quantum limit for information per dose. In the case of phase imaging, we argue this limit is at least an order of magnitude beyond what is possible with aberration-free Zernike phase contrast.

The following article has been submitted to Applied Physics Letters

References in corpus (7)

• Entanglement-free Heisenberg-limited phase estimation
• Entanglement in fermion systems and quantum metrology
• Semitransparency in interaction-free measurements
• A quantum mechanical scheme to reduce radiation damage in electron microscopy
• Reduced damage in electron microscopy by using interaction-free measurement and conditional re-illumination
• RF pulse shaping for gated electron mirrors
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Cited by in corpus (9)

• Quantum and classical Fisher information in four-dimensional scanning transmission electron microscopy
• Quantum eraser experiments for the demonstration of entanglement between swift electrons and light
• Quantum Nanophotonics with Energetic Particles:X-rays and Free Electrons
• Retrieval of phase information from low-dose electron microscopy experiments: are we at the limit yet?
• Quantum Limits of Position and Polarizability Estimation in the Optical Near Field
• Ghost Imaging with Free Electron-Photon Pairs
• Cavity cooling using ultrafast electrons
• Two-electron quantum walks can probe entanglement and decoherence in an electron microscope
• Dose-efficient Quantum Phase Estimation in Lossy Optical Interferometry