Nanoscale Texture and Microstructure in NdFeAs(O,F)/IBAD-MgO Superconducting Thin Film with Superior Critical Current Properties
arXiv:2111.10215 · doi:10.1021/acsaelm.1c00364
Abstract
This paper reports the nanoscale texture and microstructure of a high-performance NdFeAs(O,F) superconducting thin film grown by molecular beam epitaxy on a textured MgO/YO/Hastelloy substrate. The NdFeAs(O,F) film forms a highly textured columnar grain structure by epitaxial growth on the MgO template. Although the film contains stacking faults along the -plane as well as grain boundaries perpendicular to the -plane, good superconducting properties are measured: a critical temperature, , of 46 K and a self-field critical current density, , of at 4.2 K. Automated crystal orientation mapping by scanning precession electron diffraction in transmission electron microscopy is employed to analyze the misorientation angles between adjacent grains in a large ensemble (247 grains). 99% of the grain boundaries show in-plane misorientation angles () less than the critical angle , which satisfies one of the necessary conditions for the high . Comparing the columnar grain size distribution with the mean distance of the flux line lattice, the triple junctions of low-angle grain boundaries are found to be effective pinning centers, even at high temperatures (35 K) and/or low magnetic fields.
Main text with Supplement Material, 32 pages, 16 figures
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