High resolution depth profiling using near-total-reflection hard X-ray photoelectron spectroscopy

Abstract

By adjusting the incidence angle of incoming X-ray near the critical angle of X-ray total reflection, the photoelectron intensity is strongly modulated due to the variation of X-ray penetration depth. Photoelectron spectroscopy (PES) combining with near total reflection (NTR) exhibit tunable surface sensitivity, providing depth-resolved information. In this review article, we first describe the experimental setup and specific data analysis process. We then review three different examples which show the broad application of this method. The emphasis is on its applications to correlated oxide heterostructures, especially quantitative depth analyses of compositions and electronic states. In a last part, we discussed the limitations of this technique, mostly in terms of range of samples which can be studied.

28 pages, 5 figures, review paper on NTR HAXPES

References in corpus (22)

• Angle-resolved photoemission spectroscopy of the cuprate superconductors
• Probing the Low-Energy Electronic Structure of Complex Systems by ARPES
• Angle-resolved photoemission spectroscopy and its application to topological materials
• Nature of Well-Screened State in Hard X-ray Mn 2$p$ Core-Level Photoemission of La${}_{1-x}$Sr${}_x$MnO${}_3$ Films
• Evidence for suppressed metallicity on the surface of La2-xSrxCuO4 and Nd2-xCexCuO4
• In situ photoemission study on atomically-controlled La${}_{1-x}$Sr${}_x$MnO${}_3$ thin films: Composition dependence of the electronic structure
• Direct evidence for minority spin gap in the Co2MnSi Heusler alloy
• Reversible modulation of orbital occupations via an interface-induced state in metallic manganites
• Energetic, spatial and momentum character of a buried interface: the two-dimensional electron gas between two metal oxides
• The effect of interface roughness on exchange bias in La0.7Sr0.3MnO3 - BiFeO3 heterostructures
• Depth profiling charge accumulation from a ferroelectric into a doped Mott insulator
• Momentum-resolved electronic structure at a buried interface from soft x-ray standing-wave angle-resolved photoemission
• Temperature-Dependence of Magnetically-Active Charge Excitations in Magnetite across the Verwey Transition
• Magnetic properties of La(0.67)Sr(0.33)MnO3/BiFeO3(001) heterojunctions: chemically abrupt versus atomic intermixed interface
• Interface properties and built-in potential profile of a LaCrO${}_3$/SrTiO${}_3$ superlattice determined by standing-wave excited photoemission spectroscopy
• Surface enhanced covalency and Madelung potentials in Nb doped SrTiO${}_3$ (100), (110) and (111) single crystals
• Ultrafast charge transfer processes accompanying KLL Auger decay in aqueous KCl solution
• Polarization sensitive surface band structure of doped BaTiO3(001)
• Two-dimensional electron systems in perovskite oxide heterostructures: Role of the polarity-induced substitutional defects
• Near total reflection X-ray photoelectron spectroscopy: Quantifying chemistry at solid/liquid and solid/solid interfaces
• Atomic-layer-resolved composition and electronic structure of the cuprate Bi${}_2$Sr${}_2$CaCu${}_2$O${}_{8+\delta }$ from soft x-ray standing-wave photoemission
• Depth-resolved resonant inelastic x-ray scattering at a superconductor/half-metallic ferromagnet interface through standing-wave excitation

Cited by in corpus (1)

• Chemical state analysis of reactively sputtered zinc vanadium nitride: The Auger parameter as a tool in materials design