Non-parametric reconstruction of the statistical properties of penetrable, isotropic randomly rough surfaces from in-plane, co-polarized light scattering data: Application to computer generated and experimental scattering data
arXiv:2105.02745 · doi:10.1103/PhysRevA.104.043502
Abstract
An approach is introduced for the non-parametric reconstruction of the statistical properties of penetrable, isotropic randomly rough surfaces from in-plane, co-polarized light scattering data. Starting from expressions within the Kirchhoff approximation for the light scattered diffusely by a two-dimensional randomly rough surface, an analytic expression for the normalized surface height correlation function is obtained as an integral over the in-plane and co-polarized scattering data with the introduction of only a couple of additional approximations. The inversion approach consists of two main steps. In the first step the surface roughness is estimated. Next, this value is used to obtain the functional form of the surface height correlation function without initially assuming any particular form for this function (non-parametric inversion). The input data used in validating this inversion approach consist of in-plane and co-polarized scattering data obtained for different forms of the correlation function by either computer simulations or by experiments for two-dimensional randomly rough dielectric or metallic surfaces. Good agreement was obtained between the correlation function and surface roughness obtained during the reconstruction and the corresponding quantities assumed when generating the input scattering data; this was the case for both dielectric and metallic surfaces, for both p- and s-polarized light, and for different polar angles of incidence. The proposed inversion approach provides an accurate, efficient, robust and contact-less method based on in-plane and co-polarized scattering data for the non-parametric characterization of the statistical properties of isotropic two-dimensional randomly rough dielectric and metallic surface.
arXiv comment23 pages, 9 figures
References in corpus (9)
- The Scattering of Electromagnetic Waves from Two-Dimensional Randomly Rough Perfectly Conducting Surfaces: The Full Angular Intensity Distribution
- Wave scattering from self-affine surfaces
- The Scattering of Electromagnetic Waves from Two-Dimensional Randomly Rough Penetrable Surfaces
- Analytic height correlation function of rough surfaces derived from light scattering
- Numerical studies of the scattering of light from a two-dimensional randomly rough interface between two dielectric media
- Path derivation for a wave scattered model to estimate height correlation function of rough surfaces
- Determination of the normalized surface height autocorrelation function of a two-dimensional randomly rough dielectric surface by the inversion of light scattering data
- Analytical expression for wave scattering from exponential height correlated rough surfaces
- Wave scattering from two-dimensional self-affine Dirichlet and Neumann surfaces and its application to the retrieval of self-affine parameters