Analytical expression for wave scattering from exponential height correlated rough surfaces

Abstract

Wave scattering from rough surfaces in addition the inverse scattering is an interesting approach to obtain the surface topography properties in various fields. Analytical expression in wave scattering from some known rough surfaces, not only help us to understand the scattering phenomena, but also would prove adequate to be a criterion to measure the information for empirical rough surfaces. For a rough surface with an exponential height correlation function, we derive an analytical expression for the diffused part and expanded it in two asymptotic regimes. We consider one surface as slightly rough and the other as very rough based on the framework of the Kirchhoff theory. In the end, we have measured the role of various Hurst exponents and correlation lengths on scattering intensity in self-affine surfaces. We have shown that by increasing the Hurst exponent from H=0 to H=1, the diffuse scattering decreases with the scattering angle.

13 pages, 4 figures

References in corpus (3)

• Wave scattering from self-affine surfaces
• Two-Scale Kirchhoff Theory: Comparison of Experimental Observations With Theoretical Prediction
• Light scattering from an amplifying medium bounded by a randomly rough surface: A numerical study

Cited by in corpus (4)

• Analytic height correlation function of rough surfaces derived from light scattering
• Thin films thickness Measurement by the conductivity theory in the framework of born approximation
• Wave scattering from two-dimensional self-affine Dirichlet and Neumann surfaces and its application to the retrieval of self-affine parameters
• Non-parametric reconstruction of the statistical properties of penetrable, isotropic randomly rough surfaces from in-plane, co-polarized light scattering data: Application to computer generated and experimental scattering data