Absence of magnetic-proximity effect at the interface of Bi${}_2$Se${}_3$ and (Bi,Sb)${}_2$Te${}_3$ with EuS

Abstract

We performed x-ray magnetic circular dichroism (XMCD) measurements on heterostructures comprising topological insulators (TIs) of the (Bi,Sb)${}_2$(Se,Te)${}_3$ family and the magnetic insulator EuS. XMCD measurements allow us to investigate element-selective magnetic proximity effects at the very TI/EuS interface. A systematic analysis reveals that there is neither significant induced magnetism within the TI nor an enhancement of the Eu magnetic moment at such interface. The induced magnetic moments in Bi, Sb, Te, and Se sites are lower than the estimated detection limit of the XMCD measurements of $\sim 10^{-3}$ ${\mu }_{\mathrm{B}}$/at.

7 pages, 3 figures, published in Physical Review Letters

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Cited by in corpus (4)

• Van der Waals heterostructures for spintronics and opto-spintronics
• Partial Charge Transfer and Absence of Induced Magnetization in EuS(111)/Bi${}_2$Se${}_3$ Heterostructures
• Topological Insulators-Based Magnetic Heterostructure
• Search for enhanced magnetism at the interface between Bi${}_2$Se${}_3$ and EuSe