The ABC130 barrel module prototyping programme for the ATLAS strip tracker

Abstract

For the Phase-II Upgrade of the ATLAS Detector, its Inner Detector, consisting of silicon pixel, silicon strip and transition radiation sub-detectors, will be replaced with an all new 100 % silicon tracker, composed of a pixel tracker at inner radii and a strip tracker at outer radii. The future ATLAS strip tracker will include 11,000 silicon sensor modules in the central region (barrel) and 7,000 modules in the forward region (end-caps), which are foreseen to be constructed over a period of 3.5 years. The construction of each module consists of a series of assembly and quality control steps, which were engineered to be identical for all production sites. In order to develop the tooling and procedures for assembly and testing of these modules, two series of major prototyping programs were conducted: an early program using readout chips designed using a 250 nm fabrication process (ABCN-25) and a subsequent program using a follow-up chip set made using 130 nm processing (ABC130 and HCC130 chips). This second generation of readout chips was used for an extensive prototyping program that produced around 100 barrel-type modules and contributed significantly to the development of the final module layout. This paper gives an overview of the components used in ABC130 barrel modules, their assembly procedure and findings resulting from their tests.

82 pages, 66 figures

References in corpus (3)

• ROOT - A C++ Framework for Petabyte Data Storage, Statistical Analysis and Visualization
• Alternative glues for the production of ATLAS silicon strip modules for the Phase-II upgrade of the ATLAS Inner Detector
• Mapping the depleted area of silicon diodes using a micro-focused X-ray beam

Cited by in corpus (9)

• The quality control programme for ITk strip tracker module assembly
• A Starry Byte -- proton beam measurements of single event upsets and other radiation effects in ABCStar ASIC Versions 0 and 1 for the ITk strip tracker
• An extreme thermal cycling reliability test of ATLAS ITk Strips barrel modules
• Test beam measurement of ATLAS ITk Short Strip module at warm and cold operational temperature
• Quality Concerns Caused by Quality Control -- deformation of silicon strip detector modules in thermal cycling tests
• Silicon Wafer Fracture Stress for Tracking Sensors in Particle Physics Experiments
• Cracking under pressure --- investigating mitigation approaches for silicon fractures on ATLAS strip tracker petals at cold temperatures
• Extended thermal cycling of ATLAS ITk strip modules with and without stress mitigating interposers
• Threshold bounce -- occupancy-dependent modulation of the discriminating threshold in silicon detectors