Driven-state relaxation of a coupled qubit-defect system in spin-locking measurements

Abstract

It is widely known that spin-locking noise-spectroscopy is a powerful technique for the characterization of low-frequency noise mechanisms in superconducting qubits. Here we show that the relaxation rate of the driven spin-locking state of a qubit can be significantly affected by the presence of an off-resonant high-frequency two-level-system defect. Thus, both low- and high-frequency defects should be taken into account in the interpretation of spin-locking measurements and other types of driven-state noise-spectroscopy.

arXiv commentmain text (6 pages, 3 figures) + supplemental material (8 pages, 9 figures)

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Cited by in corpus (7)

• Native two-qubit gates in fixed-coupling, fixed-frequency transmons beyond cross-resonance interaction
• Identification of different types of high-frequency defects in superconducting qubits
• Characterizing non-Markovian Off-Resonant Errors in Quantum Gates
• Preparing ground states of the XXZ model using the quantum annealing with inductively coupled superconducting flux qubits
• How to experimentally evaluate the adiabatic condition for quantum annealing
• Effect of Etching Methods on Dielectric Losses in Transmons
• Dynamic phases induced by two-level system defects on driven qubits