A Time-to-Digital Converter-based Correction Method for Charge Measurement through Area Integration

Abstract

A high-precision charge measurement can be achieved by the area integration of a digitized quasi-Gaussian signal after the signal passes through the shaper and analog-to-digital converter (ADC). The charge measurement contains an error due to the uncertainty of the first sampled point of a signal waveform. To reduce the error, we employ a time-to-digital converter (TDC) to measure the uncertainty precisely, and we design correction algorithms to improve the resolution of the charge measurement. This work includes analysis and simulations of the proposed algorithms and implementation of them in an FPGA device. Besides, the tests are also conducted to evaluate the performance of the correction method. Test results indicate that the resolution of the charge measurement is successfully improved from 0.231% to 0.126% by using a signal from the shaping circuit (with the amplitude of 2 V, and leading and trailing edges of about 80 ns and 280 ns, respectively) digitized at the sampling rate of 62.5 Msps.

References in corpus (10)

• Improved Measurement of Electron Antineutrino Disappearance at Daya Bay
• The Detector System of The Daya Bay Reactor Neutrino Experiment
• A 15 GSa/s, 1.5 GHz Bandwidth Waveform Digitizing ASIC
• High-speed charge-to-time converter ASIC for the Super-Kamiokande detector
• TARGET: A multi-channel digitizer chip for very-high-energy gamma-ray telescopes
• Novel Calibration Method for Switched Capacitor Arrays Enables Time Measurements with Sub-Picosecond Resolution
• The Analog Front-end Prototype Electronics Designed for LHAASO WCDA
• Proposal of the Readout Electronics for the WCDA in LHAASO Experiment
• Prototype of the Readout Electronics for WCDA in LHAASO
• A new method of waveform digitization based on time-interleaved A/D conversion