Measurements of Angle-Resolved Reflectivity of PTFE in Liquid Xenon with IBEX

Abstract

Liquid xenon particle detectors rely on excellent light collection efficiency for their performance. This depends on the high reflectivity of polytetrafluoroethylene (PTFE) at the xenon scintillation wavelength of 178 nm, but the angular dependence of this reflectivity is not well-understood. IBEX is designed to directly measure the angular distribution of xenon scintillation light reflected off PTFE in liquid xenon. These measurements are fully described by a microphysical reflectivity model with few free parameters. Dependence on PTFE type, surface finish, xenon pressure, and wavelength of incident light is explored. Total internal reflection is observed, which results in the dominance of specular over diffuse reflection and a reflectivity near 100% for high angles of incidence.

arXiv comment21 pages, 10 figures

References in corpus (11)

• The Large Underground Xenon (LUX) Experiment
• The XENON1T Dark Matter Experiment
• The EXO-200 detector, part I: Detector design and construction
• Measurements of the intrinsic quantum efficiency and absorption length of tetraphenyl butadiene thin films in the vacuum ultraviolet regime
• Measurement of the refractive index and attenuation length of liquid xenon for its scintillation light
• Calibration, event reconstruction, data analysis and limits calculation for the LUX dark matter experiment
• Reflectance of Polytetrafluoroethylene (PTFE) for Xenon Scintillation Light
• Measurement of the absolute reflectance of polytetrafluoroethylene (PTFE) immersed in liquid xenon
• Performance of a Chamber for Studying the Liquid Xenon Response to Nuclear Recoils
• A model of the reflection distribution in the vacuum ultra violet region
• Reflectance dependence of polytetrafluoroethylene on thickness for xenon scintillation light

Cited by in corpus (8)

• Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air
• Reduction of ${}^{222}$Rn-induced Backgrounds in a Hermetic Dual-Phase Xenon Time Projection Chamber
• Reflectance and fluorescence characteristics of PTFE coated with TPB at visible, UV, and VUV as a function of thickness
• Study of dielectric breakdown in liquid xenon with the XeBrA experiment
• Measurement of the Angular Distribution of Wavelength-Shifted Light Emitted by TPB
• VUV Transmission of PTFE for Xenon-based Particle Detectors
• Validation of the VUV-reflective coating for next-generation liquid xenon detectors
• High Voltage Delivery and Distribution for the NEXT-100 Time Projection Chamber