Error Probability in Magneto-elastic Switching of Non-ideal Nanomagnets with Defects: A Case Study for the Viability of Straintronic Logic and Memory

Abstract

Magneto-elastic (straintronic) switching of bistable magnetostrictive nanomagnets is an extremely energy-efficient switching methodology for (magnetic) binary switches that has recently attracted widespread attention because of its potential application in ultra-low-power digital computing hardware. Unfortunately, this modality of switching is also error very prone at room temperature. Theoretical studies of switching error probability of magneto-elastic switches have predicted probabilities ranging from 10E-8-10E-3 at room temperature for ideal, defect-free nanomagnets, but experiments with real nanomagnets show a much higher probability that exceeds 0.1 in some cases. The obvious spoilers that can cause this large difference are defects and non-idealities. Here, we have theoretically studied the effect of common defects (that occur during fabrication) on magneto-elastic switching probability in the presence of room-temperature thermal noise. Surprisingly, we found that even small defects increase the switching error probabilities by orders of magnitude. There is usually a critical stress that leads to the lowest error probability and its value increases enormously in the presence of defects. All this could limit or preclude the application of magneto-elastic (straintronic) binary switches in either Boolean logic or memory, despite their excellent energy-efficiency, and restrict them to non-Boolean (e.g. neuromorphic, stochastic) computing applications. We also studied the difference between magneto-elastic switching with a stress pulse of constant amplitude and sinusoidal time-varying amplitude (e.g. due to a surface acoustic wave) and found that the latter method is more reliable and generates lower switching error probabilities in most cases, provided the time variation is reasonably slow.

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