Anisotropic Charge Distribution Induced by Spin Polarization in LaSrMnO Thin Films Studied by X-ray Magnetic Linear Dichroism
arXiv:1810.09077 · doi:10.7566/JPSJ.87.114713
Abstract
Magnetic anisotropy of epitaxially grown thin films is affected by the strain from the substrates due to a combined effect of distorted electronic structure and spin-orbit interaction (SOI). As an inverse process, one expects an anisotropy of the electronic structure induced by magnetization in the presence of SOI. We have studied the charge-density anisotropy induced by magnetization in thin films of the ferromagnetic metal LaSrMnO via x-ray magnetic linear dichroism (XMLD). XMLD measurements on thin films with various thicknesses have shown that the XMLD intensity is proportional to the square of the ferromagnetic moment. Using the XMLD sum rule and cluster-model calculation, it has been shown that more Mn 3 electrons are distributed in orbitals elongated along the direction parallel to the spin polarization than in orbitals elongated in the direction perpendicular to it. The cluster-model calculation has shown that the effect of tensile strain from the SrTiO substrate on the XMLD spectra is also consistent with the observed XMLD spectral line shapes.
arXiv comment12 pages, 4 figures
References in corpus (6)
- Critical thickness and orbital ordering in ultrathin La0.7Sr0.3MnO3 films
- Evidence of orbital reconstruction at interfaces in La0.67Sr0.33MnO3 films
- Origin of perpendicular magneto-crystalline anisotropy in L10-FeNi under tetragonal distortion
- Nature of magnetic coupling between Mn ions in as-grown GaMnAs studied by x-ray magnetic circular dichroism
- Anisotropic spin-density distribution and magnetic anisotropy of strained LaSrMnO thin films: Angle-dependent x-ray magnetic circular dichroism
- Thickness-dependent ferromagnetic metal to paramagnetic insulator transition in LaSrMnO thin films studied by x-ray magnetic circular dichroism