Implanting germanium into graphene
arXiv:1802.04660 · doi:10.1021/acsnano.8b01191
Abstract
Incorporating heteroatoms into the graphene lattice may be used to tailor its electronic, mechanical and chemical properties. Direct substitutions have thus far been limited to incidental Si impurities and P, N and B dopants introduced using low-energy ion implantation. We present here the heaviest impurity to date, namely Ge ions implanted into monolayer graphene. Although sample contamination remains an issue, atomic resolution scanning transmission electron microscopy imaging and quantitative image simulations show that Ge can either directly substitute single atoms, bonding to three carbon neighbors in a buckled out-of-plane configuration, or occupy an in-plane position in a divacancy. First principles molecular dynamics provides further atomistic insight into the implantation process, revealing a strong chemical effect that enables implantation below the graphene displacement threshold energy. Our results show that heavy atoms can be implanted into the graphene lattice, pointing a way towards advanced applications such as single-atom catalysis with graphene as the template.
20 pages, 5 figures
References in corpus (18)
- Electric Field Effect in Atomically Thin Carbon Films
- The SIESTA method for ab initio order-N materials simulation
- Efficient index handling of multidimensional periodic boundary conditions
- 30 inch Roll-Based Production of High-Quality Graphene Films for Flexible Transparent Electrodes
- Ultrahigh electron mobility in suspended graphene
- Graphene Photonics and Optoelectronics
- Manipulating low-dimensional materials down to the level of single atoms with electron irradiation
- Atomistic simulations of the implantation of low energy boron and nitrogen ions into graphene
- Silicon-carbon bond inversions driven by 60 keV electrons in graphene
- Single atom manipulation and control in a scanning transmission electron microscope
- Computational insights and the observation of SiC nanograin assembly: towards 2D silicon carbide
- Single-atom spectroscopy of phosphorus dopants implanted into graphene
- Towards atomically precise manipulation of 2D nanostructures in the electron microscope
- Isotope analysis in the transmission electron microscope
- Cleaning graphene: comparing heat treatments in air and in vacuum
- Implantation and atomic scale investigation of self-interstitials in graphene
- Efficient first principles simulation of electron scattering factors for transmission electron microscopy
- Structure and Electronic States of a Graphene Double Vacancy with an Embedded Si Dopant
Cited by in corpus (11)
- Germagraphene as promising anode material for Lithium-ion batteries predicted from first-principles calculations
- Doping transition-metal atoms in graphene for atomic-scale tailoring of electronic, magnetic, and quantum topological properties
- Electron-beam Introduction of Heteroatomic Pt-Si Structures in Graphene
- Graphene Lattices with Embedded Transition-Metal Atoms and Tunable Magnetic Anisotropy Energy: Implications for Spintronic Devices
- Substitutional Si impurities in monolayer hexagonal boron nitride
- Buckling and metastability in membranes with dilation arrays
- Indirect measurement of the carbon adatom migration barrier on graphene
- Direct visualization of the 3D structure of silicon impurities in graphene
- Top-down fabrication of atomic patterns in twisted bilayer graphene
- Electronic structural critique of interesting thermal and optical properties of CGe germagraphene
- Creation and Microscopic Origins of Single-Photon Emitters in Transition Metal Dichalcogenides and Hexagonal Boron Nitride