Measurements of charging-up processes in THGEM-based particle detectors
arXiv:1801.00533 · doi:10.1088/1748-0221/13/03/P03009
Abstract
The time-dependent gain variation of detectors incorporating Thick Gas Electron Multipliers (THGEM) electrodes was studied in the context of charging-up processes of the electrode's insulating surfaces. An experimental study was performed to examine model-simulation results of the aforementioned phenomena, under various experimental conditions. The results indicate that in a stable detector's environment, the gain stabilization process is mainly affected by the charging-up of the detector's insulating surfaces caused by the avalanche charges. The charging-up is a transient effect, occurring during the detector's initial operation period; it does not affect its long-term operation. The experimental results are consistent with the outcome of model-simulations.
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- Systematic investigation of critical charge limits in Thick GEMs
- First results of Resistive-Plate Well (RPWELL) detector operation at 163 K
- Direct measurements of the properties of Thick-GEM reflective photocathodes
- Electron transfer efficiency in liquid xenon across THGEM holes
- A Novel Manufacturing Process for Glass THGEMs and First Characterisation in an Optical Gaseous Argon TPC
- Impact of trace amounts of water on the stability of Micro-Pattern Gaseous Detectors measured in Ar-CO (90-10)