Direct S-matrix calculation for diffractive structures and metasurfaces
arXiv:1712.08361 · doi:10.1103/PhysRevE.97.063301
Abstract
The paper presents a derivation of analytical components of S-matrices for arbitrary planar diffractive structures and metasurfaces in the Fourier domain. Attained general formulas for S-matrix components can be applied within both formulations in the Cartesian and curvilinear metric. A numerical method based on these results can benefit from all previous improvements of the Fourier domain methods. In addition, we provide expressions for S-matrix calculation in case of periodically corrugated layers of 2D materials, which are valid for arbitrary corrugation depth-to-period ratios. As an example the derived equations are used to simulate resonant grating excitation of graphene plasmons and an impact of silica interlayer on corresponding reflection curves.
21 pages, 5 figures
References in corpus (8)
- Boron nitride substrates for high-quality graphene electronics
- Micrometer-scale ballistic transport in encapsulated graphene at room temperature
- Optical far-infrared properties of graphene monolayer and multilayers
- The optical conductivity of graphene in the visible region of the spectrum
- A Primer on Surface Plasmon-Polaritons in Graphene
- Electronic superlattices in corrugated graphene
- Numerical methods for calculating poles of the scattering matrix with applications in grating theory
- Impact of graphene on the polarizability of a neighbour nanoparticle: a dyadic Green's function study