paper

Measurement of the surface susceptibility and the surface conductivity of atomically thin by spectroscopic ellipsometry

arXiv:1710.00340 · doi:10.1364/OL.43.000703

Abstract

We show how to correctly extract from the ellipsometric data the surface susceptibility and the surface conductivity that describe the optical properties of monolayer . Theoretically, these parameters stem from modelling a single-layer two-dimensional crystal as a surface current, a truly two-dimensional model. Currently experimental practice is to consider this model equivalent to a homogeneous slab with an effective thickness given by the interlayer spacing of the exfoliating bulk material. We prove that the error in the evaluation of the surface susceptibility of monolayer , owing to the use of the slab model, is at least 10% or greater, a significant discrepancy in the determination of the optical properties of this material.

Keywords: Ellipsometry, graphene, MoS2, two dimensional crystals, optical contrast, absorption, transition metal dichalcogenide monolayers

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