The edge delamination of monolayer transition metal dichalcogenides

Abstract

Delamination of thin films from the supportive substrates is critical issues in thin film industry and technology. The emergent two-dimensional materials, atomic layered materials, such as transition metal dichalcogenides are highly flexible thus the buckles and wrinkles can be easily generated and play vital effects on the physical properties. Here we introduce one kind of patterned buckling behavior caused by the delamination from substrate initiated at the edges of the chemical vapor deposition synthesized monolayer transition metal dichalcogenides, mainly due to the thermal expansion mismatch. The atomic force microscopy and optical characterizations clearly showed the puckered structures associated with strains, whereas the transmission electron microscopy revealed the special sawtooth shaped edge structures which break the geometrical symmetry of the buckling behavior of hexagonal samples. The condition of this edge delamination is in accordance with the fracture theory. This edge delamination process and buckling upon synthesis is universal for most of the ultrathin two dimensional materials, and it is definitely noteworthy in their future applications.

arXiv comment18 pages, 6 figures

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• Investigation of Growth-Induced Strain in Monolayer MoS2 Grown by Chemical Vapor Deposition
• Synthesis of built-in highly strained monolayer MoS2 using liquid precursor chemical vapor deposition
• Imaging Nanoscale Inhomogeneities and Edge Delamination in As-Grown MoS2 Using Tip-Enhanced Photoluminescence
• Unidirectional Rashba Spin Splitting in Single Layer WS${}_{2(1-x)}$Se${}_{2x}$ alloy
• Curvature-enhanced localised emission from dark states in wrinkled monolayer WSe2 at room temperature
• Symmetric Domain Segmentation in WS2 Flakes: Correlating spatially resolved photoluminescence, conductance with valley polarization