Defects and oxidation resilience in
arXiv:1705.05519 · doi:10.1103/PhysRevB.96.054112
Abstract
We use density functional theory to study intrinsic defects and oxygen related defects in indium selenide. We find that is prone to oxidation, but however not reacting with oxygen as strongly as phosphorene. The dominant intrinsic defects in -rich material are the interstitial, a shallow donor, and the vacancy, which introduces deep traps. The latter can be passivated by oxygen, which is isoelectronic with . The dominant intrinsic defects in -rich material have comparatively higher formation energies.
arXiv comment9 pages, 8 figures, 2 tables, 49 references
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Cited by in corpus (6)
- The role of traps in the photocurrent generation mechanism in thin In-Se photodetectors
- The optical properties of few-layer InSe
- Spin-orbit coupling, optical transitions, and spin pumping in mono- and few-layer InSe
- Effects of Graphene/BN Encapsulation, Surface Functionalization and Molecular Adsorption on the Electronic Properties of Layered InSe: A First-Principles Study
- Electrical detection of the flat band dispersion in van der Waals field-effect structures
- Indium selenides for next-generation low-power computing devices