Tunneling Field-Effect Junctions with WS barrier
arXiv:1705.01205
Abstract
Transition metal dichalcogenides (TMDCs), with their two-dimensional structures and sizable bandgaps, are good candidates for barrier materials in tunneling field-effect transistor (TFET) formed from atomic precision vertical stacks of graphene and insulating crystals of a few atomic layers in thickness. We report first-principles study of the electronic properties of the Graphene/WS/Graphene sandwich structure revealing strong interface effects on dielectric properties and predicting a high ON/OFF ratio with an appropriate WS thickness and a suitable range of the gate voltage. Both the band spin-orbit coupling splitting and the dielectric constant of the WS layer depend on its thickness when in contact with the graphene electrodes, indicating strong influence from graphene across the interfaces. The dielectric constant is significantly reduced from the bulk WS value. The effective barrier height varies with WS thickness and can be tuned by a gate voltage. These results are critical for future nanoelectronic device designs.
arXiv comment18 pages, 5 figures
References in corpus (10)
- Quantum ESPRESSO: a modular and open-source software project for quantum simulations of materials
- Coupled spin and valley physics in monolayers of MoS2 and other group-VI dichalcogenides
- Van der Waals density functionals applied to solids
- Control of graphene's properties by reversible hydrogenation
- Control of valley polarization in monolayer MoS2 by optical helicity
- Evolution of Electronic Structure in Atomically Thin Sheets of WS2 and WSe2
- Gate-induced insulating state in bilayer graphene devices
- Measurement of the optical dielectric function of transition metal dichalcogenide monolayers: MoS2, MoSe2, WS2 and WSe2
- Atomically thin boron nitride: a tunnelling barrier for graphene devices
- Thickness-dependent Dielectric Constant of Few-layer In2Se3 Nano-flakes