Finite-size and composition-driven topological phase transition in (BiIn)Se thin films
arXiv:1608.06307 · doi:10.1021/acs.nanolett.6b02044
Abstract
In a topological insulator (TI), if its spin-orbit coupling (SOC) strength is gradually reduced, the TI eventually transforms into a trivial insulator beyond a critical point of SOC, at which point the bulk gap closes: this is the standard description of the topological phase transition (TPT). However, this description of TPT, driven solely by the SOC (or something equivalent) and followed by closing and reopening of the bulk band gap, is valid only for infinite-size samples, and little is known how TPT occurs for finite-size samples. Here, using both systematic transport measurements on interface-engineered(BiIn)Se thin films and theoretical simulations (with animations in Supporting Information) we show that description of TPT in finite-size samples needs to be substantially modified from the conventional picture of TPT due to surface-state hybridization and bulk confinement effects. We also show that the finite-size TPT is composed of two separate transitions, topological-normal transition (TNT) and metal-insulator transition (MIT) by providing a detailed phase diagram in the two-dimensional phase space of sample size and SOC strength.
16 pages, 3 figures + 14 page appendix To appear in Nano letters
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Cited by in corpus (7)
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- Quantum-Hall to Insulator Transition in Ultra-low-carrier-density Topological Insulator Films and a Hidden Phase of the Zeroth Landau Level
- Ferromagnetic Anomalous Hall Effect in Cr-doped BiSe Thin Films via Surface-State Engineering
- Observation of optical absorption correlated with surface state of topological insulator
- Non-unique connection between bulk topological invariants and surface physics