High-fidelity trapped-ion quantum logic using near-field microwaves
arXiv:1606.08409 · doi:10.1103/PhysRevLett.117.140501
Abstract
We demonstrate a two-qubit logic gate driven by near-field microwaves in a room-temperature microfabricated ion trap. We measure a gate fidelity of 99.7(1)\%, which is above the minimum threshold required for fault-tolerant quantum computing. The gate is applied directly to Ca "atomic clock" qubits (coherence time ) using the microwave magnetic field gradient produced by a trap electrode. We introduce a dynamically-decoupled gate method, which stabilizes the qubits against fluctuating a.c.\ Zeeman shifts and avoids the need to null the microwave field.
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Cited by in corpus (7)
- Microwaves in Quantum Computing
- Robust two-qubit gates in a linear ion crystal using a frequency-modulated driving force
- Robust and resource-efficient microwave near-field entangling Be gate
- Fast dynamical decoupling of the Molmer-Sorensen entangling gate
- Feasibility study of quantum computing using trapped electrons
- Hybrid Microwave Radiation Patterns for High-Fidelity Quantum Gates with Trapped Ions
- Trapped-Ion Entangling Gates Robust Against Qubit Frequency Errors